The NEXSA is a multi-technique surface science instrument for XPS, UPS, ISS, REELS, and Raman spectroscopy. Its combined analysis modes can provide a full understanding of the elements - and their chemical & valence electron states - present on the surface of a sample. 

Specifications: 

• X-ray - Al-K-alpha monochromated micro-focused source. spot size variable from 10 - 400 microns for XPS.
• UV - He arc source automatically switchable from He1 emission at 21.2 eV to He2 emission at 40.8 eV for UPS.
• Electron - mixed-mode flood gun
  • Low-energy (~20 eV electrons and Ar+ ions for charge compensation
  • Higher energy (1000 eV electrons for REELS)
• Ion - MAGCIS combined monatomic/cluster 4000 eV ion source for surface cleaning, depth profiles, and ISS scans.
• Visible - 532 nm laser with automated optics for in-situ Raman spectroscopy. 

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