The Bruker Dimension ICON AFM is a multi-mode scanning probe microscope (SPM) allowing users to image nanoscale features on the surface of their sample. In addition to topographical imaging, the system has multiple measurement modes.

The system is designed to scan large samples up to 150 mm in diameter and 20 mm thick. It is also capable of running fluid measurements to collect in-situ data for organic & biological samples.

Specifications

• Maximum Z-range: 13 microns
• Maximum X-Y scan size: 90 microns
• Z-resolution: 40 pm
• Measurement modes available (Magnetic Force Microscopy (MFM), Kelvin Probe Force Microscopy (KPFM), conductive AFM (c-AFM), Piezoresponse Force Microscopy (PFM), Scanning Capacitive Microscopy (SCM), and Quantitative Nanomechanical property Measurements (QNM)
   

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