The Createc Cryo-SPM operates as a scanning tunneling microscope (STM) or non-contact atomic force microscope (nc-AFM). Both modes achieve sub-nanometer lateral and vertical resolution. STM probes the local density of states on electrically conductive or semiconductive materials. Similarly, nc-AFM detects short-range (angstrom-scale) chemical forces and provides elemental contrast through force spectroscopy. High-resolution images can be combined with spectroscopic data to generate atomic scale hyperspectral maps The in-situ preparation chamber supports UHV sample annealing, ion sputtering, molecular deposition, and low-energy electron diffraction. 

Specifications:

• LN2 (77K) and LHe (5K) operation
• Ion-pumped chambers w/ base pressures <10-10 mbar
• Compatible with qPlus probes for simultaneous STM & AFM
• 2.3T superconducting magnet for spin transport studies
• Very low helium consumption: 4 liters in 72 h guaranteed, more than 100 h achieved (4 days!)
• Very low nitrogen consumption: 14 l in 72 h guaranteed, more than 86 h achieved.
• Scan range: 1.6 µm (X, Y) / 0.2µm (Z) at 5 K, 5x larger at RT.
• Tunneling current: > 1 pA (Femto DLPCA200) / > 100 fA (Createc internal preamplifier)
• Very small drift: < 1 Å/h in thermal equilibrium
• Spectroscopy: I/V, dI/dV, d2I/dV2 using external or internal Lock-in amp