The Axia ChemiSEM Scanning Electron Microscope (SEM) has:

• A thermionic tungsten filament source
• Automated alignment & sample navigation
• Variable pressure mode
• A backscatter detector
• Live quantitative elemental mapping
   

The ChemiSEM continuously collects energy dispersive spectroscopy (EDS) data in the background, allowing elemental information to be toggled on/off.

This feature allows users to emphasize or isolate elements and regions of the sample by superimposing a sample's elemental makeup over its morphology in real time. 
 

Use this tool