The Materials Characterization Facility has four transmission electron microscopy machines plus one FIB/SEM. New TEM users should first request training on either the JEOL 100CX or Hitachi HT7700. After becoming familiar with the basics of TEM operation on one of those systems, we are happy to train users on the higher-resolution FEI Tecnai F30 or Hitachi HD2700.
FEI Tecnai F30
The F30 is a 300 kV TEM, equipped with an EDS detector and Gatan image filter system (Tridiem 863 UHS), which can do elemental EELS mapping. The sample holders include a Tomography Holder (High Field of View), and both heating and cryo holders from Gatan.
Hitachi HT7700
The HT7700 is an advanced Transmission Electron Microscope for imaging nano-material specimens. There are separate modes for low magnification/ High Contrast (HC) imaging and high magnification/ High Resolution (HR) imaging.
HD2700
The HD2700 is an aberration-corrected dedicated scanning transmission electron microscope (STEM), which can be operated at 80, 120, or 200 kV. Its HAADF-STEM image resolution is ~0.136 nm. A SDD EDS detector is also attached for elemental analysis. It has in-situ heating capability with heating temperature up to 1200C.