The Materials Characterization Facility (MCF) at Georgia Tech is a state-of-the-art core facility for materials analysis. It offers a wide range of imaging and microanalysis capabilities, including:
- Electron Microscopy: This includes both Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM), which allow for high-resolution imaging and analysis at the micro and nano scales.
- Scanning Probe Microscopy: Techniques such as Atomic Force Microscopy (AFM) are used to analyze surface properties at the atomic level.
- Optical Microscopy and Spectroscopy: These tools are used for imaging and analyzing materials using light, including techniques like confocal microscopy.
- X-Ray Diffraction and Spectroscopy: These methods are used to determine the crystallographic structure and composition of materials.
- Surface Science: This includes techniques for analyzing the chemical composition and physical properties of surfaces.
- Mechanical Testing: Tools for testing the mechanical properties of materials, such as hardness and tensile strength.
Available to academic, industry, and government users 24 hours a day with a uniform set of fees and policies, the MCF offers access to the latest in imaging and analysis technology and tools. Additionally, the MCF employs highly skilled technical staff to support your research.